原子力显微镜
Atomic Force Microscope
型号:德国Bruker Dimension ICON
功能:用于表征材料表面形貌特征。
技术参数:
﹡XY方向扫描范围:90µm×90µm
﹡Z方向扫描范围:14µm
﹡具备多种成像模式,包括闭环模式、智能模式、接触模式、轻敲模式。
﹡功能附件:磁力显微镜、侧向力显微镜、调频和高压开尔文探针显微镜。
Model: Bruker Dimension ICON
Function: Used to characterize the surface morphology of materials.
Technical Parameters:
﹡X-Y scan range: 90µm x 90µm typical
﹡Z range: 14µm typical in imaging and force curve modes
﹡AFM modes: close-loop mode, smart imaging mode, tapping mode, contact mode.
﹡Accessories: Magnetic Force Microscopy, Lateral force microscopy, Frequency modulation and High-voltage Kelvin Probe Force Microscopy .
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